多通道固态存储器测试系统设计与研究
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1.中北大学电子测试技术国家重点实验室 太原 030051;2.仪器科学与动态测试教育部重点实验室 太原 030051

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TP29

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国家自然科学基金青年科学基金(51705475)


Design and research of multichannel solid state memory testing system
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1. State Key Laboratory of Electronic Testing Technology, North University of China, Taiyuan 030051; 2. Key Laboratory of Instrument Science and Dynamic Testing, Ministry of Education, Taiyuan 030051

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    摘要:

    针对现有存储器测试系统测试通道少、被测存储介质种类单一和自动化程度低的问题,设计了一种通用自动化存储器测试系统。系统由上位机、硬件测试电路和千兆以太网组成。上位机在VS2015环境下开发,对系统下发测试指令并显示测试结果,硬件测试电路完成对存储介质数据的读取及回传,千兆以太网实现两者数据的高速交换。本系统可以对多路SATA接口和 ONFI接口的存储器进行性能测试,从而提高了存储器的测试效率,降低了测试成本。多次实验结果表明,该系统具有良好的环境适应性和可扩展性,在航天领域有较高的工程应用价值。

    Abstract:

    Aiming at the problems of less test channels, single type of measured storage media and low degree of automation in the existing memory test system, a universal automatic memory test system was designed. The system consists of upper computer, hardware test circuit and Gigabit Ethernet. The upper computer is developed under the environment of VS2015, and sends test instructions to the system and displays test results. The hardware test circuit completes the reading and return of data from the storage medium. The gigabit Ethernet realizes the high-speed exchange of data between the two. This system can test the performance of the memory with SATA interface and ONFI interface, so as to improve the testing efficiency of the memory and reduce the testing cost. The results of many experiments show that the system has good environmental adaptability and expansibility, and has high engineering application value in aerospace field.

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李张倩,马银鸿,洪应平,刘文怡,熊继军,张会新.多通道固态存储器测试系统设计与研究[J].电子测量技术,2021,44(9):158-162

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  • 在线发布日期: 2024-09-29
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