基于单片机的电路设备导通测试装置设计
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中北大学仪器与电子学院 太原 030051

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TP2

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Design of Circuit Equipment Conduction Test Device Based on Single Chip Microcomputer
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School of Instruments and Electronics, North University of China, Taiyuan 030051, China

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    摘要:

    在当今不断发展高度信息化、高度自动化、高度集成的技术时代,大型电气设备越来越多地使用多芯线缆。而多芯线缆又会较多的受到外界各种环境的影响,非常容易失效。多芯线缆的性能已成为影响系统整体可靠性的重要因素。而现在一直存在线缆检测的困难。目前主要的检测手段是人工检测。针对以上问题本文设计研究了一款电路设备导通测试装置。该装置以ATmega64单片机为其核心控制部件,利用CD4051芯片进行导通测试通道的选择,采用 TLP521-4芯片进行数字信号隔离处理,再将测量得到的导通结果数据传送至单片机并通过 MAX232芯片与串口助手进行数据的传送。最后对测试系统进行测试获得测试结果并分析结果。

    Abstract:

    High In today's highly information-based, highly automated and highly integrated technology era, multi-core cables are increasingly used in large-scale electrical equipment. Multi-core cable will be affected by various external environments, so it is very easy to fail. The performance of multi-core cable has become an important factor affecting the overall reliability of the system. At present, cable detection is always difficult. At present, the main detection means is manual detection. In view of the above problems, this paper designs and studies a circuit equipment conduction test device. In this device, ATmega64 single chip microcomputer is taken as its core control component, CD4051 chip is used to select the conduction test channel, TLP521-4 chip is used to isolate the digital signal, and then the measured conduction result data is transmitted to the single chip microcomputer and transmitted with serial port assistant through MAX232 chip. Finally, the test system is tested to obtain the test results and analyze the results.

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田登辉,李锦明.基于单片机的电路设备导通测试装置设计[J].电子测量技术,2022,45(3):32-36

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  • 在线发布日期: 2024-06-14
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