Systems on Chip implemented with deep submicron，in order to solve due to the temperature uncertainty induced by process variation, proposed a MultiTemperature and Low Power Test Scheduling method. The method adopted to build multiple temperature sensor in the chip, through the temperature sensor to sense the temperature of the builtin, multipoint collection in the core part of SoC, the highest value of using temperature feedback to the control system, temperature regulation and control. The scheduling test satisfies a condition in the temperature, power consumption and bus bandwidth situation, avoid chip local overheating. Experimental results on ITC′02 benchmark circuits show that ,compared with the literature ［2］, the method can guarantee the chip thermal safety at the same time, the average CPU time decreased by more than 10.33%, the test application time average reduction of 11.14%