The practical application of fault diagnosis method is limited because of the lack of accurate failure mode analysis, and in order to solve this problem, a hierarchical analysis framework for failure mode and effect analysis (FMEA) is proposed in this paper. This method divides the FMEA analysis into three levels: the device level, the board level and system level. As to the device level, accelerated stress test method is proposed to analyze the temporal deterministic effect. As to the board level and system level FMEA, a limit test platform is developed. The specification boundary for electronics system can be acquired using this platform, as well as the test method and fault mode. Using the method proposed in this paper, the failure mode of whole electronic system can be acquired, and provide practical application basis for fault diagnosis.