慕林芳,何玉珠.基于特殊测试点隔离算法的测试节点选择[J].电子测量技术,2017,40(6):101-104
基于特殊测试点隔离算法的测试节点选择
Test point selection based on special test point separation algorithm
  
DOI:
中文关键词:  模拟电路  故障字典  特殊测试点隔离  测试点选择
英文关键词:analog circuits  fault dictionary  special test point separation  test point selection
基金项目:
作者单位
慕林芳 北京航空航天大学仪器科学与光电工程学院北京100191 
何玉珠 北京航空航天大学仪器科学与光电工程学院北京100191 
AuthorInstitution
Mu Linfang School of Instrumentation and Optoelectronics Engineering, Beijing Hangkong University,Beijing 100191,China 
He Yuzhu School of Instrumentation and Optoelectronics Engineering, Beijing Hangkong University,Beijing 100191,China 
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中文摘要:
      测试点的选择问题作为模拟电路故障诊断的基础性问题,如何找到数目最少的测试点以隔离电路的所有故障成为研究的重点,常用的测试点选择方法大多为故障字典法。研究发现,如果电路中一种特定的故障只能由一个特殊的测试点进行隔离,那么将这种特殊测试点选出可以大大简化故障字典,然后完成剩余有效测试点的选择和冗余测试点的移除,即可选出最优的测试点集合。这种方法称为特殊测试点隔离算法,通过对比实验,发现该算法很好的平衡了测试点选择中对时间和精度的要求,而且具有更高的效率。
英文摘要:
      The selection of test points is the basic problem of analog circuit fault diagnosis.How to find the least number of test points to isolate all the fault circuit has become the focus of the study.Commonly used test point selection methods are mostly fault dictionary method.The study found that if a particular fault in the circuit can only be isolated by a special test point,then taking this special test point out can greatly simplify the fault dictionary, by finishing the selection of the remaining valid test points and the removal of redundant test points, the best set of test points can be chosen. This method is called special test point isolation algorithm. Through compared experiment, it is found that the proposed algorithm balances the requirements of time and accuracy in test point selection. What is more, it has a higher efficiency.
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