The radiated immunity measurement of ICs has become a major factor limiting the performance of electronic equipment. Up to now, the radiated immunity measurement methods of IC mainly include TEM cell method, GTEM cell method, IC stripline method and near-field scanning immunity method, but how to choose these methods is a dilemma. Moreover, with increasing frequency spectrum of disturbance sources to GHz range, some methods present their problems as well. In aspects of test set-up and pros, four IC radiated immunity measurement methods are described in this paper, with their frequency range, interference field strength and cost compared and analyzed. From test set-up to adjustment of test condition, the whole steps of IC radiated immunity measurement are induced. In addition, the key problems and solutions of the four methods are listed. Finally, this paper puts forward the principles and suggestions for methods selection. Being the reference for testers, the research results can be used for the selection and improvement of IC Radiated Immunity measurement.