Failure mode and effect analysis method for complex electronics system

Home > Archive>Volume 39, Issue 4, 2016 >156-159

Failure mode and effect analysis method for complex electronics system
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                        Yuan Xincheng1Yuan Xincheng
Beijing Aerospace Automatic Control Institute，Beijing 100854，China
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Yang Zhiming2Yang Zhiming
Department of Automatic Test and Control，Harbin Institute of Technology，Harbin 150001，China
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Yu Yang2Yu Yang
Department of Automatic Test and Control，Harbin Institute of Technology，Harbin 150001，China
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Peng Xiyuan2Peng Xiyuan
Department of Automatic Test and Control，Harbin Institute of Technology，Harbin 150001，China
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Peng Yu2Peng Yu
Department of Automatic Test and Control，Harbin Institute of Technology，Harbin 150001，China
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Liu Wang2Liu Wang
Department of Automatic Test and Control，Harbin Institute of Technology，Harbin 150001，China
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Zhang Shiping2Zhang Shiping
Department of Automatic Test and Control，Harbin Institute of Technology，Harbin 150001，China
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Affiliation:1. Beijing Aerospace Automatic Control Institute，Beijing 100854，China; 2. Department of Automatic Test and Control，Harbin Institute of Technology，Harbin 150001，China
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Abstract:

The practical application of fault diagnosis method is limited because of the lack of accurate failure mode analysis, and in order to solve this problem, a hierarchical analysis framework for failure mode and effect analysis (FMEA) is proposed in this paper. This method divides the FMEA analysis into three levels: the device level, the board level and system level. As to the device level, accelerated stress test method is proposed to analyze the temporal deterministic effect. As to the board level and system level FMEA, a limit test platform is developed. The specification boundary for electronics system can be acquired using this platform, as well as the test method and fault mode. Using the method proposed in this paper, the failure mode of whole electronic system can be acquired, and provide practical application basis for fault diagnosis.

Key words:complex electronic system; fault mode analysis; accelerated stress test; limit test

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Online: May 25,2016
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