Qiao Yuqi
1. School of Instrument and Electronics, North University of China, Taiyuan 030051 China; 2. Shanxi Province Automation Testing and System Engineering Technology Research Center, Taiyuan 030051 ChinaYang Ruifeng
1. School of Instrument and Electronics, North University of China, Taiyuan 030051 China; 2. Shanxi Province Automation Testing and System Engineering Technology Research Center, Taiyuan 030051 ChinaGuo Chenxia
1. School of Instrument and Electronics, North University of China, Taiyuan 030051 China; 2. Shanxi Province Automation Testing and System Engineering Technology Research Center, Taiyuan 030051 China1. School of Instrument and Electronics, North University of China, Taiyuan 030051 China; 2. Shanxi Province Automation Testing and System Engineering Technology Research Center, Taiyuan 030051 China
TM351