Li Zhangqian
1. State Key Laboratory of Electronic Testing Technology, North University of China, Taiyuan 030051; 2. Key Laboratory of Instrument Science and Dynamic Testing, Ministry of Education, Taiyuan 030051Ma Yinhong
1. State Key Laboratory of Electronic Testing Technology, North University of China, Taiyuan 030051; 2. Key Laboratory of Instrument Science and Dynamic Testing, Ministry of Education, Taiyuan 030051Hong Yingping
1. State Key Laboratory of Electronic Testing Technology, North University of China, Taiyuan 030051; 2. Key Laboratory of Instrument Science and Dynamic Testing, Ministry of Education, Taiyuan 030051Liu Wenyi
1. State Key Laboratory of Electronic Testing Technology, North University of China, Taiyuan 030051; 2. Key Laboratory of Instrument Science and Dynamic Testing, Ministry of Education, Taiyuan 030051Xiong Jijun
1. State Key Laboratory of Electronic Testing Technology, North University of China, Taiyuan 030051; 2. Key Laboratory of Instrument Science and Dynamic Testing, Ministry of Education, Taiyuan 030051Zhang Huixin
1. State Key Laboratory of Electronic Testing Technology, North University of China, Taiyuan 030051; 2. Key Laboratory of Instrument Science and Dynamic Testing, Ministry of Education, Taiyuan 0300511. State Key Laboratory of Electronic Testing Technology, North University of China, Taiyuan 030051; 2. Key Laboratory of Instrument Science and Dynamic Testing, Ministry of Education, Taiyuan 030051
TP29
