Design and research of multichannel solid state memory testing system
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1. State Key Laboratory of Electronic Testing Technology, North University of China, Taiyuan 030051; 2. Key Laboratory of Instrument Science and Dynamic Testing, Ministry of Education, Taiyuan 030051

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TP29

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    Abstract:

    Aiming at the problems of less test channels, single type of measured storage media and low degree of automation in the existing memory test system, a universal automatic memory test system was designed. The system consists of upper computer, hardware test circuit and Gigabit Ethernet. The upper computer is developed under the environment of VS2015, and sends test instructions to the system and displays test results. The hardware test circuit completes the reading and return of data from the storage medium. The gigabit Ethernet realizes the high-speed exchange of data between the two. This system can test the performance of the memory with SATA interface and ONFI interface, so as to improve the testing efficiency of the memory and reduce the testing cost. The results of many experiments show that the system has good environmental adaptability and expansibility, and has high engineering application value in aerospace field.

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  • Online: September 29,2024
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