Zhang Shuai
1.State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebeil University of Technology Tianjin 300130 2.Hebei Key Laboratory of Bioelectromagnetic and Neural engineering, Hebeil University of Technology Tianjin 300130Li Mengdi
1.State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebeil University of Technology Tianjin 300130 2.Hebei Key Laboratory of Bioelectromagnetic and Neural engineering, Hebeil University of Technology Tianjin 300130Wang Yixiao
1.State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebeil University of Technology Tianjin 300130 2.Hebei Key Laboratory of Bioelectromagnetic and Neural engineering, Hebeil University of Technology Tianjin 300130Jiao Lipeng
1.State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebeil University of Technology Tianjin 300130 2.Hebei Key Laboratory of Bioelectromagnetic and Neural engineering, Hebeil University of Technology Tianjin 300130Xu Guizhi
1.State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebeil University of Technology Tianjin 300130 2.Hebei Key Laboratory of Bioelectromagnetic and Neural engineering, Hebeil University of Technology Tianjin 3001301.State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebeil University of Technology Tianjin 300130 2.Hebei Key Laboratory of Bioelectromagnetic and Neural engineering, Hebeil University of Technology Tianjin 300130
TM12