Zhang Ruihao
1.State Key Laboratory of Electronic Testing Technology, North University of China,Taiyuan 030051, China; 2.Key Laboratory of Instrument Science and Dynamic Testing, Ministry of Education,Taiyuan 030051, ChinaLi Yunze
1.State Key Laboratory of Electronic Testing Technology, North University of China,Taiyuan 030051, China; 2.Key Laboratory of Instrument Science and Dynamic Testing, Ministry of Education,Taiyuan 030051, ChinaDang Lizhi
1.State Key Laboratory of Electronic Testing Technology, North University of China,Taiyuan 030051, China; 2.Key Laboratory of Instrument Science and Dynamic Testing, Ministry of Education,Taiyuan 030051, ChinaHong Yingping
1.State Key Laboratory of Electronic Testing Technology, North University of China,Taiyuan 030051, China; 2.Key Laboratory of Instrument Science and Dynamic Testing, Ministry of Education,Taiyuan 030051, China1.State Key Laboratory of Electronic Testing Technology, North University of China,Taiyuan 030051, China; 2.Key Laboratory of Instrument Science and Dynamic Testing, Ministry of Education,Taiyuan 030051, China
TN919