Sun Kun
School of Electronics Information Engineering, Hebei University of Technology,Tianjin 300401, ChinaWu Yi
1.School of Electronics Information Engineering, Hebei University of Technology,Tianjin 300401, China; 2.Electronics and Communication Engineering National Experimental Teaching Demonstration Center, Hebei University of Technology,Tianjin 300401, ChinaNiu Yarui
School of Electronics Information Engineering, Hebei University of Technology,Tianjin 300401, ChinaLu Hao
School of Electronics Information Engineering, Hebei University of Technology,Tianjin 300401, ChinaZhao Pu
School of Electronics Information Engineering, Hebei University of Technology,Tianjin 300401, China1.School of Electronics Information Engineering, Hebei University of Technology,Tianjin 300401, China; 2.Electronics and Communication Engineering National Experimental Teaching Demonstration Center, Hebei University of Technology,Tianjin 300401, China
TP391.41