Yang Chaoqun
1.State Key Laboratory of Reliability and Intelligence of Electrical Equipment (Hebei University of Technology), Beichen District, Tianjin 300401, China; 2.Key Laboratory of Electromagnetic Field and Electrical Apparatus Reliability of Hebei Province (Hebei University of Technology), Beichen District,Tianjin 300401, ChinaDuan Shuyong
State Key Laboratory of Reliability and Intelligence of Electrical Equipment (Hebei University of Technology), Beichen District, Tianjin 300401, ChinaYang Tianhao
1.State Key Laboratory of Reliability and Intelligence of Electrical Equipment (Hebei University of Technology), Beichen District, Tianjin 300401, China; 2.Key Laboratory of Electromagnetic Field and Electrical Apparatus Reliability of Hebei Province (Hebei University of Technology), Beichen District,Tianjin 300401, ChinaLi Shanhu
1.State Key Laboratory of Reliability and Intelligence of Electrical Equipment (Hebei University of Technology), Beichen District, Tianjin 300401, China; 2.Key Laboratory of Electromagnetic Field and Electrical Apparatus Reliability of Hebei Province (Hebei University of Technology), Beichen District,Tianjin 300401, China1.State Key Laboratory of Reliability and Intelligence of Electrical Equipment (Hebei University of Technology), Beichen District, Tianjin 300401, China; 2.Key Laboratory of Electromagnetic Field and Electrical Apparatus Reliability of Hebei Province (Hebei University of Technology), Beichen District,Tianjin 300401, China
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