Liu Gang
1.Jiangsu Province Engineering Research Center of Integrated Circuit Reliability Technology and Testing System, Wuxi University, Wuxi 214105, China; 2.School of Electronic and Information Engineering, Nanjing University of Information Science and Technology, Nanjing 210044, ChinaYan Shuguang
School of Electronic and Information Engineering, Nanjing University of Information Science and Technology, Nanjing 210044, ChinaLiu Yu
Jiangsu Province Engineering Research Center of Integrated Circuit Reliability Technology and Testing System, Wuxi University, Wuxi 214105, ChinaHou Enxiang
School of Electronic and Information Engineering, Nanjing University of Information Science and Technology, Nanjing 210044, ChinaHuang Yingzheng
School of Electronic and Information Engineering, Nanjing University of Information Science and Technology, Nanjing 210044, China1.Jiangsu Province Engineering Research Center of Integrated Circuit Reliability Technology and Testing System, Wuxi University, Wuxi 214105, China; 2.School of Electronic and Information Engineering, Nanjing University of Information Science and Technology, Nanjing 210044, China
TP391.4; TN914